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What is OGP VMS?

VMS™ is a sophisticated metrology software system that operates in 2½ D, seamlessly combining strong parametric programming with integrated scripting capabilities to create custom routines and user interfaces. This software offers a wide array of features that enhance its ability to tackle difficult lighting conditions, subtle edges, and part variations effectively. With the Area Multi-Focus (AMF) feature, users can produce a detailed 3D dataset through a standard autofocus process, serving as a fast alternative to conventional laser surface scanning techniques. Moreover, the Continuous Image Capture (CIC) feature synchronizes lighting with camera frame acquisition and XY stage movement, facilitating video image collection during motion. In addition, the software allows for native video® processing, enabling users to evaluate stored images using the same tools applied to live captures, which guarantees consistency in data assessments. This adaptability and functionality of VMS™ make it an exceptional choice for a diverse array of metrology tasks, appealing to professionals seeking precision and efficiency. As such, it stands out in the marketplace as a comprehensive solution for intricate measurement needs.

What is Analyst X?

Analyst X, an advanced software solution developed by ScanTech Instruments, is expertly designed for B-scan ultrasonic inspections in non-destructive testing scenarios. This cutting-edge application simplifies the reporting workflow, allowing users to generate scan plans and B-scans with just a single click, while also enabling the overlay of multiple B-scans for improved comparative analysis. It generates detailed data tables that present the high, average, and low values for each scan, and includes a re-gating functionality that refines scan data after collection, leading to clear and accurate scan maps. Users can also benefit from automated statistical analyses to extract meaningful insights from their scan results. The software features an intuitive interface with guided calibration to assist users during setup, and it supports automated data acquisition. Furthermore, users can adjust gain settings before or during scanning, and they have the ability to monitor in real-time with options for instant adjustments. The convenience of pausing and resuming scans as needed further enhances the user experience, making Analyst X a vital tool for achieving precise and efficient data analysis in various field applications. Ultimately, the integration of these capabilities ensures that users are equipped to produce high-quality outcomes with ease and confidence.

Media

Media

Integrations Supported

Additional information not provided

Integrations Supported

Additional information not provided

API Availability

Has API

API Availability

Has API

Pricing Information

Pricing not provided.
Free Trial Offered?
Free Version

Pricing Information

Pricing not provided.
Free Trial Offered?
Free Version

Supported Platforms

SaaS
Android
iPhone
iPad
Windows
Mac
On-Prem
Chromebook
Linux

Supported Platforms

SaaS
Android
iPhone
iPad
Windows
Mac
On-Prem
Chromebook
Linux

Customer Service / Support

Standard Support
24 Hour Support
Web-Based Support

Customer Service / Support

Standard Support
24 Hour Support
Web-Based Support

Training Options

Documentation Hub
Webinars
Online Training
On-Site Training

Training Options

Documentation Hub
Webinars
Online Training
On-Site Training

Company Facts

Organization Name

OGP

Date Founded

1945

Company Location

United States

Company Website

www.ogpnet.com/products/software/metrology-software/vms/

Company Facts

Organization Name

Scantech Instruments

Date Founded

1997

Company Location

United States

Company Website

scanndt.com/products/ndt-software/analyst-x-software-for-b-scanning/

Categories and Features

Categories and Features

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