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What is CIVA?

CIVA is a comprehensive software solution designed for simulation and analysis in Non-Destructive Testing (NDT) applications, equipped with advanced tools for Ultrasonic Testing (UT), Eddy Current Testing (ECT), and Radiographic Testing (RT). This software provides robust modeling capabilities that enable users to simulate inspection methods, facilitating the prediction and evaluation of NDT techniques in a controlled virtual environment before conducting real inspections. By allowing users to model defect detection, characterize material properties, and visualize inspection scenarios in detail, CIVA significantly enhances the optimization of inspection processes, reduces costs, and increases reliability. Its user-friendly interface, combined with powerful computational algorithms, renders it an essential tool across industries such as aerospace, energy, and manufacturing, where safety and precision are paramount. Moreover, CIVA equips engineers to effectively analyze inspection parameters, enhance the reliability of defect identification, and ensure compliance with industry standards, thereby promoting a culture of safety and excellence in NDT practices. As a result, organizations that utilize CIVA can achieve more efficient inspections and maintain higher quality assurance in their operations.

What is Analyst X?

Analyst X, an advanced software solution developed by ScanTech Instruments, is expertly designed for B-scan ultrasonic inspections in non-destructive testing scenarios. This cutting-edge application simplifies the reporting workflow, allowing users to generate scan plans and B-scans with just a single click, while also enabling the overlay of multiple B-scans for improved comparative analysis. It generates detailed data tables that present the high, average, and low values for each scan, and includes a re-gating functionality that refines scan data after collection, leading to clear and accurate scan maps. Users can also benefit from automated statistical analyses to extract meaningful insights from their scan results. The software features an intuitive interface with guided calibration to assist users during setup, and it supports automated data acquisition. Furthermore, users can adjust gain settings before or during scanning, and they have the ability to monitor in real-time with options for instant adjustments. The convenience of pausing and resuming scans as needed further enhances the user experience, making Analyst X a vital tool for achieving precise and efficient data analysis in various field applications. Ultimately, the integration of these capabilities ensures that users are equipped to produce high-quality outcomes with ease and confidence.

Media

Media

Integrations Supported

Additional information not provided

Integrations Supported

Additional information not provided

API Availability

Has API

API Availability

Has API

Pricing Information

Pricing not provided.
Free Trial Offered?
Free Version

Pricing Information

Pricing not provided.
Free Trial Offered?
Free Version

Supported Platforms

SaaS
Android
iPhone
iPad
Windows
Mac
On-Prem
Chromebook
Linux

Supported Platforms

SaaS
Android
iPhone
iPad
Windows
Mac
On-Prem
Chromebook
Linux

Customer Service / Support

Standard Support
24 Hour Support
Web-Based Support

Customer Service / Support

Standard Support
24 Hour Support
Web-Based Support

Training Options

Documentation Hub
Webinars
Online Training
On-Site Training

Training Options

Documentation Hub
Webinars
Online Training
On-Site Training

Company Facts

Organization Name

EXTENDE

Date Founded

2010

Company Location

France

Company Website

www.extende.com

Company Facts

Organization Name

Scantech Instruments

Date Founded

1997

Company Location

United States

Company Website

scanndt.com/products/ndt-software/analyst-x-software-for-b-scanning/

Categories and Features

Categories and Features

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