JTAG Maps vs. Ansys PathFinder

JTAG Maps™, a user-friendly extension for Altium, enables engineers to efficiently evaluate the testing capabilities offered by JTAG devices integrated into their designs. Previously, engineers dedicated significant time to manually marking boundary-scan nets within a design to assess their coverage. The boundary scan device model files, known as BSDLs, play an essential role in the JTAG and boundary scanning process by specifying which pins can be manipulated through JTAG. JTAG Maps supports BSDL models and includes an option to 'assume scanner covered.' While many users may opt for the Altium coverage report provided by JTAG Maps, there is also an option to import a more comprehensive analysis. Additionally, data can be exported to JTAG ProVision for in-depth evaluation, allowing engineers to gain further insights. Subsequently, a straightforward message file that encompasses complete fault-coverage details can be re-imported into JTAG Maps for visualization and highlighting purposes. This streamlined process significantly reduces the time engineers need to spend on testing assessments.

Ansys PathFinder-SC is a powerful and high-capacity tool specifically created for the effective planning, validation, and approval of IP and full-chip SoC designs, ensuring their durability and dependability against electrostatic discharge (ESD). By identifying the key elements that lead to design issues potentially resulting in chip failures due to occurrences like charged-device models (CDM) and human body models (HBM), Ansys PathFinder-SC provides essential insights for improvements. Its cloud-native architecture leverages the capabilities of thousands of computing cores, allowing for rapid full-chip turnaround times. Additionally, this solution has achieved certification from prominent foundries for performing current density evaluations and ESD approvals. With an all-encompassing integrated data modeling, extraction, and transient simulation engine, PathFinder-SC presents a streamlined end-to-end process for ESD verification. The tool utilizes a single-pass model that efficiently interprets standard design formats, sets ESD criteria, extracts resistive-capacitive (RC) values for the power network, and conducts ESD simulations to explore root causes, ultimately offering actionable recommendations for corrections and optimizations—all within a unified application. This comprehensive level of integration not only boosts operational efficiency but also significantly enhances the reliability of chip designs, making it an indispensable resource for engineers in the field. Moreover, the continuous updates and support ensure that users remain equipped with the latest advancements in ESD verification technology.