XJTAG DFT Assistant Reviews

Altium Develop brings together engineers, developers, and manufacturing partners in a single connected workspace. By integrating design tools with real-time collaboration, it ensures that every stakeholder—from hardware and software teams to supply chain managers—can contribute at the right moment. The platform eliminates silos by linking requirements, component data, and production insights directly to the design process. With early visibility and seamless feedback loops, organizations can reduce errors, cut rework costs, and move from idea to finished product more efficiently.

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JTAG Maps™, a user-friendly extension for Altium, enables engineers to efficiently evaluate the testing capabilities offered by JTAG devices integrated into their designs. Previously, engineers dedicated significant time to manually marking boundary-scan nets within a design to assess their coverage. The boundary scan device model files, known as BSDLs, play an essential role in the JTAG and boundary scanning process by specifying which pins can be manipulated through JTAG. JTAG Maps supports BSDL models and includes an option to 'assume scanner covered.' While many users may opt for the Altium coverage report provided by JTAG Maps, there is also an option to import a more comprehensive analysis. Additionally, data can be exported to JTAG ProVision for in-depth evaluation, allowing engineers to gain further insights. Subsequently, a straightforward message file that encompasses complete fault-coverage details can be re-imported into JTAG Maps for visualization and highlighting purposes. This streamlined process significantly reduces the time engineers need to spend on testing assessments.